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Centro Nacional de Microelectronica CS

Catalonia (ESP). Government. Institution in Excellence Maps
Output
Normalized Impact
Patents

Research

Output1,226-7.8%
Excellence with Leadership51-13.6%
Normalized Impact1.02-11.5%
Normalized Impact Leadership0.78-8.2%
Scientific Talent Pool579-2%
Scientific Leadership600-7.6%
International Collaboration621-9.1%
High Quality Publications610-9.1%
Excellence151-17.9%
Open Access59.87+9.2%
Not Own Journals1,226-7.8%
Own Journals0= 0%

Collaboration network

Both the size of the circles and the width of the lines reflect the number of collaborative documents. The colour shows the number of citations per document.

Innovation

Innovative Knowledge63+3.3%
Technological Impact5.28+10%
Patents0= 0%

Societal

plumx463-4.9%
mendeley1,046-12.1%